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Rf and Microwave Modeling and Measurement Techniques for Field Effect Transistors - Electromagnetics and Radar
Jianjun Gao
Rf and Microwave Modeling and Measurement Techniques for Field Effect Transistors - Electromagnetics and Radar
Jianjun Gao
350 pages, illustrations
Media | Boeken Hardcover Book (Boek met harde rug en kaft) |
Vrijgegeven | 30 juni 2010 |
ISBN13 | 9781891121890 |
Uitgevers | SciTech Publishing Inc |
Pagina's | 350 |
Afmetingen | 589 g |