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Applied Scanning Probe Methods III: Characterization - NanoScience and Technology Softcover reprint of hardcover 1st ed. 2006 edition
Applied Scanning Probe Methods III: Characterization - NanoScience and Technology
There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.
378 pages, 268 black & white illustrations, 2 colour illustrations, 3 black & white tables, biograph
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 12 februari 2010 |
| ISBN13 | 9783642065965 |
| Uitgevers | Springer-Verlag Berlin and Heidelberg Gm |
| Pagina's | 378 |
| Afmetingen | 155 × 235 × 21 mm · 639 g |
| Taal en grammatica | Duits |
| Uitgever | Bhushan, Bharat |
| Uitgever | Fuchs, Harald |