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Focused Ion Beam Systems: Basics and Applications
Nan Yao
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Focused Ion Beam Systems: Basics and Applications
Nan Yao
This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.
408 pages, 196 b/w illus.
| Media | Boeken Hardcover Book (Boek met harde rug en kaft) |
| Vrijgegeven | 13 september 2007 |
| ISBN13 | 9780521831994 |
| Uitgevers | Cambridge University Press |
| Pagina's | 408 |
| Afmetingen | 252 × 180 × 29 mm · 862 g |
| Taal en grammatica | Engels |
| Uitgever | Yao, Nan (Princeton University, New Jersey) |
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