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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing Mohammad Tehranipoor 2008 edition
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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing
Mohammad Tehranipoor
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes.
424 pages, 1, black & white illustrations
| Media | Boeken Hardcover Book (Boek met harde rug en kaft) |
| Vrijgegeven | 10 december 2007 |
| ISBN13 | 9780387747460 |
| Uitgevers | Springer-Verlag New York Inc. |
| Pagina's | 408 |
| Afmetingen | 155 × 235 × 23 mm · 811 g |
| Taal en grammatica | Engels |
| Uitgever | Tehranipoor, Mohammad |
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