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![Cover for Manoj Sachdev · Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing (Hardcover Book) [2nd ed. 2007 edition] (2007)](https://imusic.b-cdn.net/images/item/original/463/9780387465463.jpg?manoj-sachdev-2007-defect-oriented-testing-for-nano-metric-cmos-vlsi-circuits-frontiers-in-electronic-testing-hardcover-book&class=scaled&v=1409993270)