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Reflection High-Energy Electron Diffraction
Ichimiya, Ayahiko (Nagoya University, Japan)
Reflection High-Energy Electron Diffraction
Ichimiya, Ayahiko (Nagoya University, Japan)
Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED and describes detailed experimental and theoretical treatments for experts.
366 pages, black & white illustrations
Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
Vrijgegeven | 17 februari 2011 |
ISBN13 | 9780521184021 |
Uitgevers | Cambridge University Press |
Pagina's | 366 |
Afmetingen | 171 × 245 × 20 mm · 636 g |
Taal en grammatica | Engels |
Bekijk alles van Ichimiya, Ayahiko (Nagoya University, Japan) ( bijv. Paperback Book en Hardcover Book )