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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing Kumar, Ch Sateesh (University of Johannesburg, South Africa)
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions - Advanced Materials Processing and Manufacturing
Kumar, Ch Sateesh (University of Johannesburg, South Africa)
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
130 pages, 52 Line drawings, black and white; 5 Halftones, black and white; 57 Illustrations, black
| Media | Boeken Paperback Book (Boek met zachte kaft en gelijmde rug) |
| Vrijgegeven | 29 november 2024 |
| ISBN13 | 9781032375113 |
| Uitgevers | Taylor & Francis Ltd |
| Pagina's | 130 |
| Afmetingen | 234 × 156 × 11 mm · 238 g |
| Taal en grammatica | Engels |
